STRUCTURAL AND MAGNETIC PROPERTIES OF FE/SI MULTILAYER GROWN BY HELICON PLASMA SPUTTERING
DOI:
https://doi.org/10.17146/jusami.2003.5.1.5201Keywords:
Fe/Si Multilayer, structural and magnetic properties, helicon plasma Sputtering, magnetoresistanceAbstract
STRUCTURAL AND MAGNETIC PROPERTIES OF FE/SI MULTILAYER GROWN BY HELICON PLASMA SPUTTERING. Helicon plasma sputtering method has been used to grown the Fe/Si multilayer (MLs) with various thickness of Silicon spacer around 0.5 ~ 2nm for Fe thickness fixed at 2nm in order to investigated the antiferromagnetic coupling behaviour. Also we grown the MLs with various Fe thickness around 2-5nm for Silicon spacer fixed at tSi =l nm and l.5nm. Present study found that in case of Silicon spacer thickness tSi= l nm multilayer film exhibit antiferromagnetically ordering, beside this thickness the MLs are ferromagnetic. The maximum magnetoresistance ratio is 0.22%, it appears at the Fe thickness tFe=3nm and Si thickness tSi=l nm.Downloads
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Published
31-10-2003
How to Cite
Setyo Purwanto, Isao Sakamoto, M. Koike, & H. Tanoue. (2003). STRUCTURAL AND MAGNETIC PROPERTIES OF FE/SI MULTILAYER GROWN BY HELICON PLASMA SPUTTERING. Jurnal Sains Materi Indonesia, 5(1), 24–28. https://doi.org/10.17146/jusami.2003.5.1.5201
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